Name: Boundary-Scan Test: A Practical Approach (en Inglés)
Price: 197890.00 CLP
Availability: InStock
Author: Bleeker, Harry ; Van Den Eijnden, Peter ; de Jong, Frans
ISBN: 9781461363712

portada Boundary-Scan Test: A Practical Approach (en Inglés)

Formato

Libro Físico

Autor

Harry Bleeker

Peter Van Den Eijnden

Frans de Jong

Editorial

Springer

Idioma

Inglés

N° páginas

225

Encuadernación

Tapa Blanda

Dimensiones

23.4 x 15.6 x 1.3 cm

Peso

0.35 kg.

ISBN13

9781461363712

Categorías

Cam: manufactura asistida por ordenador
Ingeniería eléctrica
Electrónica: circuitos y componentes
Diseño asistido por ordenador (cad)

Boundary-Scan Test: A Practical Approach (en Inglés)

Harry Bleeker (Autor) · Peter Van Den Eijnden (Autor) · Frans de Jong (Autor) · Springer · Tapa Blanda

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Origen: Estados Unidos (Costos de importación incluídos en el precio)

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Reseña del libro "Boundary-Scan Test: A Practical Approach (en Inglés)"

The ever-increasing miniaturization of digital electronic components is hampering the conventional testing of Printed Circuit Boards (PCBs) by means of bed-of-nails fixtures. Basically this is caused by the very high scale of integration of ICs, through which packages with hundreds of pins at very small pitches of down to a fraction of a millimetre, have become available. As a consequence the trace distances between the copper tracks on a printed circuit board cmne down to the same value. Not only the required small physical dimensions of the test nails have made conventional testing unfeasible, but also the complexity to provide test signals for the many hundreds of test nails has grown out of limits. Therefore a new board test methodology had to be invented. Following the evolution in the IC test technology. Boundary-Scan testing hm; become the new approach to PCB testing. By taking precautions in the design of the IC (design for testability), testing on PCB level can be simplified 10 a great extent. This condition has been essential for the success of the introduction of Boundary-Sc, m Test (BST) at board level