Name: Materials and Failures in Mems and Nems (en Inglés)
Price: 220990.00 CLP
Availability: InStock
Author: Tiwari, Atul ; Raj, Baldev
ISBN: 9781119083603

portada Materials and Failures in Mems and Nems (en Inglés)

Formato

Libro Físico

Editorial

Wiley-Scrivener

Autor

Tiwari, Atul ; Raj, Baldev

Año

2015

Idioma

Inglés

N° páginas

432

Encuadernación

Tapa Dura

Dimensiones

25.7 x 18.3 x 2.8 cm

Peso

0.91 kg.

ISBN13

9781119083603

Categorías

Ingeniería electrónica

Materials and Failures in Mems and Nems (en Inglés)

Tiwari, Atul ; Raj, Baldev (Autor) · Wiley-Scrivener · Tapa Dura

Libro Físico

$ 220.990

$ 401.800

Ahorras: $ 180.810

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Envío normal

Origen: Reino Unido (Costos de importación incluídos en el precio)

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Reseña del libro "Materials and Failures in Mems and Nems (en Inglés)"

The fabrication of MEMS has been predominately achieved by etching the polysilicon material. However, new materials are in large demands that could overcome the hurdles in fabrication or manufacturing process. Although, an enormous amount of work being accomplished in the area, most of the information is treated as confidential or privileged. It is extremely hard to find the meaningful information for the new or related developments. This book is collection of chapters written by experts in MEMS and NEMS technology. Chapters are contributed on the development of new MEMS and NEMS materials as well as on the properties of these devices. Important properties such as residual stresses and buckling behavior in the devices are discussed as separate chapters. Various models have been included in the chapters that studies the mode and mechanism of failure of the MEMS and NEMS. This book is meant for the graduate students, research scholars and engineers who are involved in the research and developments of advanced MEMS and NEMS for a wide variety of applications. Critical information has been included for the readers that will help them in gaining precise control over dimensional stability, quality, reliability, productivity and maintenance in MEMS and NEMS. No such book is available in the market that addresses the developments and failures in these advanced devices.